AOMTI 2026 Concludes Successfully at 

Beijing Information Science and Technology University

From March 27th to 29th, the 2026 International Conference on Advanced Optoelectronic Measurement Technology and Instruments (AOMTI 2026) concluded successfully at Beijing Information Science and Technology University (BISTU)!

Hosted by BISTU and co-organized by Tsinghua University and the Beijing Changcheng Institute of Metrology and Measurement under the Aviation Industry Corporation of China (AVIC), the conference featured in-depth discussions and exchanges on frontier topics including optoelectronic sensing and imaging, nanoscale optoelectronic measurement, laser and spectroscopic analysis, and novel optoelectronic materials and devices. With over 200 attendees, the conference fostered a vibrant academic atmosphere and attracted active participation from young scholars.

The opening ceremony was presided over by Professor Zhou Zhehai, Dean of the School of Instrument Science and Optoelectronic Engineering at BISTU. Distinguished leaders delivered keynote addresses, including Professor Yu Shijie, Deputy Secretary of the Party Committee at BISTU and Researcher; Professor Cao Liangcai, Deputy Chair of the Department of Precision Instruments at Tsinghua University and Fellow of both SPIE and OPTICA; and Researcher Yang Yongjun, Chief Engineer at the Beijing Changcheng Institute of Metrology and Measurement, AVIC. The three leaders unanimously emphasized the need to leverage collaborative innovation across industry, academia, and research to drive a profound transformation in optoelectronic measurement technology — from measurement to perception, from unidimensional to multidimensional, and from offline to intelligent — thereby accelerating the pursuit of self-reliant and controllable high-end instruments.

The morning plenary sessions were chaired respectively by Professor Cao Liangcai of Tsinghua University and Researcher Wu Tengfei of the Beijing Changcheng Institute of Metrology and Measurement, featuring four outstanding keynote presentations by leading experts in the field of optoelectronic measurement technology and instruments. Professor Dong Yi from the Beijing Institute of Technology shared key breakthroughs in phase-sensitive optical frequency domain reflectometry (OFDR) for distributed fiber-optic sensing; Professor Kong Lingjie from Tsinghua University demonstrated innovative applications combining optical microscopy imaging with genetic engineering in brain-computer interfaces; Professor Mao Guilin from Jiangsu Normal University provided a systematic introduction to the unique value of deep ultraviolet resonance Raman spectroscopy in trace substance identification; and Professor Zhu Jiang from BISTU presented translational achievements of optical coherence elastography in biomechanical measurement of biological tissues.

In the afternoon, two parallel sessions were held, covering four major trending topics in the field of optoelectronic measurement technology and instruments: optoelectronic detection, fiber-optic sensing, optoelectronic devices, and optoelectronic measurement. Over twenty outstanding young scholars from across China were invited to deliver presentations, providing clear and comprehensive reports on their latest research findings. The parallel sessions featured lively discussions, with attending scholars and graduate students actively raising questions regarding technical challenges and the expansion of application scenarios presented in the talks. The reporting experts responded with detailed answers drawing on their own research experience.

AOMTI 2026 was not only an academic gathering of excellence but also a concentrated showcase of frontier exploration and collaborative innovation across industry, academia, and research in the field of optoelectronic measurement. It has injected strong momentum into advancing the self-reliance of high-end measurement instruments and the cultivation of young talent. Looking ahead, we look forward to more experts, scholars, and industry colleagues joining hands to jointly write a new chapter in the development of optoelectronic measurement technology!